A Comparison between Probabilistic Artificial Neural Network and Simulated Annealing in Finding the Minimum-Norm Residual Solution to Linear Systems of Equations

Rodrigo Jamisola; Elmer P. Dadios; Marcelo H. Ang

A Comparison between Probabilistic Artificial Neural Network and Simulated Annealing in Finding the Minimum-Norm Residual Solution to Linear Systems of Equations

Rodrigo Jamisola, Elmer P. Dadios, Marcelo H. Ang

Mechanical, Energy & Industrial Engineering

Research output: Contribution to conference › Paper › peer-review

Original language	English
Publication status	Published - 2008
Event	1st AUN/SEEDNet Regional Conference in Manufacturing Engineering - Manila, Philippines Duration: Nov 24 2008 → Nov 25 2008

Conference

Conference	1st AUN/SEEDNet Regional Conference in Manufacturing Engineering
Country/Territory	Philippines
City	Manila
Period	11/24/08 → 11/25/08

Cite this

@conference{d7f3a892a42f4ef5915ab7d3011ef199,

title = "A Comparison between Probabilistic Artificial Neural Network and Simulated Annealing in Finding the Minimum-Norm Residual Solution to Linear Systems of Equations",

author = "Rodrigo Jamisola and Dadios, \{Elmer P.\} and Ang, \{Marcelo H.\}",

year = "2008",

language = "English",

note = "1st AUN/SEEDNet Regional Conference in Manufacturing Engineering ; Conference date: 24-11-2008 Through 25-11-2008",

}

A Comparison between Probabilistic Artificial Neural Network and Simulated Annealing in Finding the Minimum-Norm Residual Solution to Linear Systems of Equations. / Jamisola, Rodrigo; Dadios, Elmer P.; Ang, Marcelo H.
2008. Paper presented at 1st AUN/SEEDNet Regional Conference in Manufacturing Engineering, Manila, Philippines.

Research output: Contribution to conference › Paper › peer-review

TY - CONF

T1 - A Comparison between Probabilistic Artificial Neural Network and Simulated Annealing in Finding the Minimum-Norm Residual Solution to Linear Systems of Equations

AU - Jamisola, Rodrigo

AU - Dadios, Elmer P.

AU - Ang, Marcelo H.

PY - 2008

Y1 - 2008

M3 - Paper

T2 - 1st AUN/SEEDNet Regional Conference in Manufacturing Engineering

Y2 - 24 November 2008 through 25 November 2008

ER -