Corrigendum to "Nanoindentation measurements of the mechanical properties of polycrystalline Au and Ag thin films on silicon substrates: Effects of grain size and film thickness" [Mater. Sci. Eng. A 427 (2006) 232-240] (DOI:10.1016/j.msea.2006.04.080)

Yifang Cao; Seyed Allameh; Derek Nankivil; T. Stephen Sathiaraj; Tom Otiti; Wole Soboyejo

doi:10.1016/j.msea.2008.06.002

Corrigendum to "Nanoindentation measurements of the mechanical properties of polycrystalline Au and Ag thin films on silicon substrates: Effects of grain size and film thickness" [Mater. Sci. Eng. A 427 (2006) 232-240] (DOI:10.1016/j.msea.2006.04.080)

Yifang Cao, Seyed Allameh, Derek Nankivil, T. Stephen Sathiaraj, Tom Otiti, Wole Soboyejo

Physics & Astronomy

Research output: Contribution to journal › Comment/debate › peer-review

3 Citations (Scopus)

Original language	English
Number of pages	1
Journal	Materials Science and Engineering A
Volume	494
Issue number	1-2
DOIs	https://doi.org/10.1016/j.msea.2008.06.002
Publication status	Published - 2008

All Science Journal Classification (ASJC) codes

Materials Science(all)

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10.1016/j.msea.2008.06.002

http://www.sciencedirect.com/science/article/pii/S0921509308006667

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Cao, Y., Allameh, S., Nankivil, D., Sathiaraj, T. S., Otiti, T., & Soboyejo, W. (2008). Corrigendum to "Nanoindentation measurements of the mechanical properties of polycrystalline Au and Ag thin films on silicon substrates: Effects of grain size and film thickness" [Mater. Sci. Eng. A 427 (2006) 232-240] (DOI:10.1016/j.msea.2006.04.080). Materials Science and Engineering A, 494(1-2). https://doi.org/10.1016/j.msea.2008.06.002

Cao, Yifang ; Allameh, Seyed ; Nankivil, Derek et al. / Corrigendum to "Nanoindentation measurements of the mechanical properties of polycrystalline Au and Ag thin films on silicon substrates : Effects of grain size and film thickness" [Mater. Sci. Eng. A 427 (2006) 232-240] (DOI:10.1016/j.msea.2006.04.080). In: Materials Science and Engineering A. 2008 ; Vol. 494, No. 1-2.

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title = "Corrigendum to {"}Nanoindentation measurements of the mechanical properties of polycrystalline Au and Ag thin films on silicon substrates: Effects of grain size and film thickness{"} [Mater. Sci. Eng. A 427 (2006) 232-240] (DOI:10.1016/j.msea.2006.04.080)",

author = "Yifang Cao and Seyed Allameh and Derek Nankivil and Sathiaraj, {T. Stephen} and Tom Otiti and Wole Soboyejo",

year = "2008",

doi = "10.1016/j.msea.2008.06.002",

language = "English",

volume = "494",

journal = "Materials Science & Engineering A: Structural Materials: Properties, Microstructure and Processing",

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Cao, Y, Allameh, S, Nankivil, D, Sathiaraj, TS, Otiti, T & Soboyejo, W 2008, 'Corrigendum to "Nanoindentation measurements of the mechanical properties of polycrystalline Au and Ag thin films on silicon substrates: Effects of grain size and film thickness" [Mater. Sci. Eng. A 427 (2006) 232-240] (DOI:10.1016/j.msea.2006.04.080)', Materials Science and Engineering A, vol. 494, no. 1-2. https://doi.org/10.1016/j.msea.2008.06.002

Corrigendum to "Nanoindentation measurements of the mechanical properties of polycrystalline Au and Ag thin films on silicon substrates: Effects of grain size and film thickness" [Mater. Sci. Eng. A 427 (2006) 232-240] (DOI:10.1016/j.msea.2006.04.080). / Cao, Yifang; Allameh, Seyed; Nankivil, Derek et al.
In: Materials Science and Engineering A, Vol. 494, No. 1-2, 2008.

Research output: Contribution to journal › Comment/debate › peer-review

TY - JOUR

T1 - Corrigendum to "Nanoindentation measurements of the mechanical properties of polycrystalline Au and Ag thin films on silicon substrates

T2 - Effects of grain size and film thickness" [Mater. Sci. Eng. A 427 (2006) 232-240] (DOI:10.1016/j.msea.2006.04.080)

AU - Cao, Yifang

AU - Allameh, Seyed

AU - Nankivil, Derek

AU - Sathiaraj, T. Stephen

AU - Otiti, Tom

AU - Soboyejo, Wole

PY - 2008

Y1 - 2008

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U2 - 10.1016/j.msea.2008.06.002

DO - 10.1016/j.msea.2008.06.002

M3 - Comment/debate

AN - SCOPUS:49849089453

SN - 0921-5093

VL - 494

JO - Materials Science & Engineering A: Structural Materials: Properties, Microstructure and Processing

JF - Materials Science & Engineering A: Structural Materials: Properties, Microstructure and Processing

IS - 1-2

ER -

Cao Y, Allameh S, Nankivil D, Sathiaraj TS, Otiti T, Soboyejo W. Corrigendum to "Nanoindentation measurements of the mechanical properties of polycrystalline Au and Ag thin films on silicon substrates: Effects of grain size and film thickness" [Mater. Sci. Eng. A 427 (2006) 232-240] (DOI:10.1016/j.msea.2006.04.080). Materials Science and Engineering A. 2008;494(1-2). doi: 10.1016/j.msea.2008.06.002

Corrigendum to "Nanoindentation measurements of the mechanical properties of polycrystalline Au and Ag thin films on silicon substrates: Effects of grain size and film thickness" [Mater. Sci. Eng. A 427 (2006) 232-240] (DOI:10.1016/j.msea.2006.04.080)

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