TY - GEN
T1 - Creep behaviour and adhesion properties of TiC thin film coating grown by RF magnetron sputtering
AU - Olayinka, Abegunde
AU - Akinlabi, Esther T.
AU - Oladijo, O. P.
N1 - Publisher Copyright:
© Springer Nature Singapore Pte Ltd 2020.
PY - 2020
Y1 - 2020
N2 - In this research study, the creep behaviour and adhesion resistance of TiC thin films grown using RF magnetron sputtering under different deposition parameters were investigated. Radio frequency (RF) magnetron sputter was used to coat the surface of CpTi with TiC target. Field electron scanning electron microscope was used to study the film morphology, and the hardness, young modulus, and creep behaviour tests were performed using TI 950 Triboindenter. The adhesion resistance property was investigated using a microscratch tester under ambient working condition. From the results, the TiC thin film morphology structures show different growth modes as the RF power changes. Films with uniform surface morphology show better adhesion resistance to peeling than films with high surface asperities, while films with heterogeneous distribution of the TiC thin films show high hardness values.
AB - In this research study, the creep behaviour and adhesion resistance of TiC thin films grown using RF magnetron sputtering under different deposition parameters were investigated. Radio frequency (RF) magnetron sputter was used to coat the surface of CpTi with TiC target. Field electron scanning electron microscope was used to study the film morphology, and the hardness, young modulus, and creep behaviour tests were performed using TI 950 Triboindenter. The adhesion resistance property was investigated using a microscratch tester under ambient working condition. From the results, the TiC thin film morphology structures show different growth modes as the RF power changes. Films with uniform surface morphology show better adhesion resistance to peeling than films with high surface asperities, while films with heterogeneous distribution of the TiC thin films show high hardness values.
UR - http://www.scopus.com/inward/record.url?scp=85091276385&partnerID=8YFLogxK
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U2 - 10.1007/978-981-15-5753-8_7
DO - 10.1007/978-981-15-5753-8_7
M3 - Conference contribution
AN - SCOPUS:85091276385
SN - 9789811557521
T3 - Lecture Notes in Mechanical Engineering
SP - 69
EP - 76
BT - Advances in Manufacturing Engineering - Selected Articles from ICMMPE 2019
A2 - Emamian, Seyed Sattar
A2 - Yusof, Farazila
A2 - Awang, Mokhtar
PB - Springer Nature, Singapore
T2 - 5th International Conference on Mechanical, Manufacturing and Plant Engineering, ICMMPE 2019
Y2 - 19 November 2019 through 21 November 2019
ER -