TY - GEN
T1 - Demystifying Fractal Analysis of Thin Films
T2 - 2nd International Conference on Mechanical Engineering Design,ICMechD 2019
AU - Mwema, F. M.
AU - Akinlabi, Esther T.
AU - Oladijo, O. P.
N1 - Publisher Copyright:
© 2021, Springer Nature Singapore Pte Ltd.
Copyright:
Copyright 2020 Elsevier B.V., All rights reserved.
PY - 2021
Y1 - 2021
N2 - In this article, a variety of synthetic (or simulated) surfaces of various morphologies of thin films and their fractal analyses are presented. Similar scaling factors have been used to generate the synthetic images in GwydionTM software. The surfaces are based on the actual morphologies arising from various thin film deposition techniques. Using actual thin films of CdTe deposited by radio-frequency (RF) sputtering technique, we have successfully shown that the fractal analyses on the synthetic surfaces can be used to explain, theoretically, the development and self-affinity of various thin films. Based on this validation, the results of fractal analyses on different morphologies of thin films were generated using different fractal methods in Gwydion software. The methods used here include Minkowski functionals, height-to-height correlation, areal autocorrelation, and power spectral density functions. The article will be a good resource for explaining the fractal behavior and morphology of thin films arising from different deposition methods.
AB - In this article, a variety of synthetic (or simulated) surfaces of various morphologies of thin films and their fractal analyses are presented. Similar scaling factors have been used to generate the synthetic images in GwydionTM software. The surfaces are based on the actual morphologies arising from various thin film deposition techniques. Using actual thin films of CdTe deposited by radio-frequency (RF) sputtering technique, we have successfully shown that the fractal analyses on the synthetic surfaces can be used to explain, theoretically, the development and self-affinity of various thin films. Based on this validation, the results of fractal analyses on different morphologies of thin films were generated using different fractal methods in Gwydion software. The methods used here include Minkowski functionals, height-to-height correlation, areal autocorrelation, and power spectral density functions. The article will be a good resource for explaining the fractal behavior and morphology of thin films arising from different deposition methods.
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U2 - 10.1007/978-981-15-4488-0_19
DO - 10.1007/978-981-15-4488-0_19
M3 - Conference contribution
AN - SCOPUS:85093904735
SN - 978-981-15-4487-3
T3 - Lecture Notes in Mechanical Engineering
SP - 213
EP - 222
BT - Trends in Mechanical and Biomedical Design - Select Proceedings of ICMechD 2019
A2 - Akinlabi, Esther Titilayo
A2 - Ramkumar, P.
A2 - Selvaraj, M.
PB - Springer Nature, Singapore
Y2 - 25 April 2019 through 26 April 2019
ER -