TY - JOUR
T1 - Dependence of fractal characteristics on the scan size of atomic force microscopy (AFM) phase imaging of aluminum thin films
AU - Mwema, F. M.
AU - Akinlabi, E. T.
AU - Oladijo, O. P.
N1 - Publisher Copyright:
© 2019 Elsevier Ltd. All rights reserved. Selection and peer-review under responsibility of the scientific committee of the 10th International Conference of Materials Processing and Characterization.
PY - 2020
Y1 - 2020
N2 - In this article, data demonstrating the effect of scan size on the fractal characteristics of phase images obtained via atomic force microscopy (AFM) are presented. The AFM phase imaging was conducted on thin aluminum films deposited on stainless steel substrates by radiofrequency (RF) magnetron sputtering at power of 150 W for 2 h and at room temperature. The AFM phase images were obtained at three different scan sizes (1 × 1 lm, 3 × 3 lm, 30 × 30 lm) at a constant scan rate and proportional-integral-deri vative (PID) control. The raw and analyzed data of the AFM visuals (micrographs) are presented in this article. The data on power spectral density functions (PDSF), fractal dimensions (D) and texture features obtained through image analyses at different scan sizes are also presented. The article also contains data (PSDF and fractal dimensions) comparing the fractal features obtained from the phase and height AFM micrographs at large scan size (30 × 30 lm). The data can be used in optimization of AFM measurement for industrial quality control.
AB - In this article, data demonstrating the effect of scan size on the fractal characteristics of phase images obtained via atomic force microscopy (AFM) are presented. The AFM phase imaging was conducted on thin aluminum films deposited on stainless steel substrates by radiofrequency (RF) magnetron sputtering at power of 150 W for 2 h and at room temperature. The AFM phase images were obtained at three different scan sizes (1 × 1 lm, 3 × 3 lm, 30 × 30 lm) at a constant scan rate and proportional-integral-deri vative (PID) control. The raw and analyzed data of the AFM visuals (micrographs) are presented in this article. The data on power spectral density functions (PDSF), fractal dimensions (D) and texture features obtained through image analyses at different scan sizes are also presented. The article also contains data (PSDF and fractal dimensions) comparing the fractal features obtained from the phase and height AFM micrographs at large scan size (30 × 30 lm). The data can be used in optimization of AFM measurement for industrial quality control.
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U2 - 10.1016/j.matpr.2020.02.316
DO - 10.1016/j.matpr.2020.02.316
M3 - Conference article
AN - SCOPUS:85084707463
SN - 2214-7853
VL - 26
SP - 1540
EP - 1545
JO - Materials Today: Proceedings
JF - Materials Today: Proceedings
IS - Part 2
T2 - 10th International Conference of Materials Processing and Characterization, ICMPC 2020
Y2 - 21 February 2020 through 23 February 2020
ER -