Fingerprint
Dive into the research topics of 'Dependence of fractal characteristics on the scan size of atomic force microscopy (AFM) phase imaging of aluminum thin films'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Dependence of fractal characteristics on the scan size of atomic force microscopy (AFM) phase imaging of aluminum thin films
F. M. Mwema, E. T. Akinlabi, O. P. Oladijo
Research output: Contribution to journal › Conference article › peer-review
2
Citations
(Scopus)