Effect of substrate type on the fractal characteristics of AFM images of sputtered aluminium thin films

Keyphrases

• AFM Images 100%
• Minkowski Functionals 100%
• Interface Width 50%
• Kurtosis 50%
• Surface Features 50%
• Leonhard Euler 50%
• Topology Characteristics 50%
• Equivalent Roughness 50%

Material Science

• Thin Films 100%
• Aluminum 100%
• Carbon Steel 33%
• Magnetron Sputtering 33%
• Titanium 33%
• Nucleation 33%
• Stainless Steel 33%
• Grain Size 33%

Engineering

• Surface Feature 33%
• Equivalent Roughness 33%