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Influence of deposition parameters on the residual stresses of WC-Wo sputtered thin films
R. R. Phiri
,
O. P. Oladijo
, E. T. Akinlabi
Chemical, Materials & Metallurgical Engineering
Botswana International University of Science & Technology
Research output
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peer-review
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Keyphrases
Residual Stress
100%
Deposition Parameters
100%
Sputtered Thin Film
100%
Substrate Surface
28%
Sputtering Parameters
28%
Measurement Method
14%
Mild Steel
14%
X Ray Diffraction
14%
Compressive Stress
14%
Amorphous Phase
14%
X-ray Spectra
14%
Steel Surface
14%
Parameter Influence
14%
Residual Stress Measurement
14%
Tribological Performance
14%
Material Science
Thin Films
100%
Residual Stress
100%
X-Ray Diffraction
12%
Carbon Steel
12%
Carbide
12%
Amorphous Material
12%
Cobalt
12%
Stress Measurement
12%
Tungsten
12%
Tribological Performance
12%
Engineering
Residual Stress Measurement
14%