Matrix-effect correction in oxide crystal Auger electron spectroscopy

Jens E.T. Andersen

doi:10.1016/0039-6028(91)90372-Y

Matrix-effect correction in oxide crystal Auger electron spectroscopy

Jens E.T. Andersen

Chemical & Forensic Sciences

Research output: Contribution to journal › Article › peer-review

7 Citations (Scopus)

Abstract

A simple model is presented for the calculation of surface elemental composition, surface impurity content and surface chemical termination in complex oxide crystal surfaces. The model is based upon Auger electron spectroscopic measurements and takes electronic inelastic mean free paths or attenuation lengths and bulk crystallographic data into consideration. Different results are obtained when using either the attenuation length or the electronic inelastic mean free path for the surfaces stoichiometric weights. MgO(100), SrTiO₃(100), LaAlO₃(100), and YBa₂Cu₃O_7-x (001) are used as test samples. Uncertainties are estimated at 10-20%.

Original language	English
Pages (from-to)	337-349
Number of pages	13
Journal	Surface Science
Volume	243
Issue number	1-3
DOIs	https://doi.org/10.1016/0039-6028(91)90372-Y
Publication status	Published - Feb 2 1991

All Science Journal Classification (ASJC) codes

Condensed Matter Physics
Surfaces and Interfaces
Surfaces, Coatings and Films
Materials Chemistry

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10.1016/0039-6028(91)90372-Y

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abstract = "A simple model is presented for the calculation of surface elemental composition, surface impurity content and surface chemical termination in complex oxide crystal surfaces. The model is based upon Auger electron spectroscopic measurements and takes electronic inelastic mean free paths or attenuation lengths and bulk crystallographic data into consideration. Different results are obtained when using either the attenuation length or the electronic inelastic mean free path for the surfaces stoichiometric weights. MgO(100), SrTiO3(100), LaAlO3(100), and YBa2Cu3O7-x (001) are used as test samples. Uncertainties are estimated at 10-20%.",

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PY - 1991/2/2

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N2 - A simple model is presented for the calculation of surface elemental composition, surface impurity content and surface chemical termination in complex oxide crystal surfaces. The model is based upon Auger electron spectroscopic measurements and takes electronic inelastic mean free paths or attenuation lengths and bulk crystallographic data into consideration. Different results are obtained when using either the attenuation length or the electronic inelastic mean free path for the surfaces stoichiometric weights. MgO(100), SrTiO3(100), LaAlO3(100), and YBa2Cu3O7-x (001) are used as test samples. Uncertainties are estimated at 10-20%.

AB - A simple model is presented for the calculation of surface elemental composition, surface impurity content and surface chemical termination in complex oxide crystal surfaces. The model is based upon Auger electron spectroscopic measurements and takes electronic inelastic mean free paths or attenuation lengths and bulk crystallographic data into consideration. Different results are obtained when using either the attenuation length or the electronic inelastic mean free path for the surfaces stoichiometric weights. MgO(100), SrTiO3(100), LaAlO3(100), and YBa2Cu3O7-x (001) are used as test samples. Uncertainties are estimated at 10-20%.

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SP - 337

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JO - Surface Science

JF - Surface Science

IS - 1-3

ER -

Matrix-effect correction in oxide crystal Auger electron spectroscopy

Abstract

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