Abstract
The optical constants of RF planar magnetron sputtered Ni-Al2O3 films are reported for the 0.3-2.5 μm wavelength range. The data are interpreted in terms of Maxwell-Garnett and Bruggeman effective medium theories. The effect of atomic Ni dispersion in the Al2O3 matrix on the effective medium formalism is discussed.
| Original language | English |
|---|---|
| Pages (from-to) | 769-775 |
| Number of pages | 7 |
| Journal | Journal of Physics D: Applied Physics |
| Volume | 30 |
| Issue number | 5 |
| DOIs | |
| Publication status | Published - Mar 7 1997 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Acoustics and Ultrasonics
- Surfaces, Coatings and Films