TY - JOUR
T1 - The impact of proton ion irradiation on Se70Te20In10 thin films
T2 - Linear and non-linear optical properties for photonic applications
AU - Matabana, Thabang K.
AU - Tabi, Conrad B.
AU - Madhuku, Morgan
AU - Sebuso, Dineo P.
AU - Muiva, Cosmas M.
N1 - Publisher Copyright:
© 2024 Elsevier B.V.
PY - 2025/1/1
Y1 - 2025/1/1
N2 - The examination of the linear and non-linear optical features was conducted on amorphous ternary Se70Te20 In10 thin films, which were exposed to proton irradiation energy of 3 MeV at varying fluences of 5×1013, 5×1014, 5×1015 and 5×1016 ions/cm2. The bulk sample was produced using the melt quenching method, and subsequently, thin films were obtained through electron beam evaporation. Calculations of linear and non-linear optical parameters were carried out based on transmittance and reflectance data acquired from UV–Vis–NIR spectroscopy spanning 300–2500 nm. Field emission scanning electron microscopy (FESEM) and X-ray diffraction (XRD) confirmed an amorphous phase in the films. The optical parameters showed strong dependency on the proton radiation fluence. In addition, the existence of minima or maxima for a number of parameters at a fluence of 5×1014 ions/cm2 showed that this was the optimum fluence. The linear and non-linear properties showed that the sample have potential applications in photonic devices.
AB - The examination of the linear and non-linear optical features was conducted on amorphous ternary Se70Te20 In10 thin films, which were exposed to proton irradiation energy of 3 MeV at varying fluences of 5×1013, 5×1014, 5×1015 and 5×1016 ions/cm2. The bulk sample was produced using the melt quenching method, and subsequently, thin films were obtained through electron beam evaporation. Calculations of linear and non-linear optical parameters were carried out based on transmittance and reflectance data acquired from UV–Vis–NIR spectroscopy spanning 300–2500 nm. Field emission scanning electron microscopy (FESEM) and X-ray diffraction (XRD) confirmed an amorphous phase in the films. The optical parameters showed strong dependency on the proton radiation fluence. In addition, the existence of minima or maxima for a number of parameters at a fluence of 5×1014 ions/cm2 showed that this was the optimum fluence. The linear and non-linear properties showed that the sample have potential applications in photonic devices.
KW - Chalcogenides
KW - Non-linear refractive index
KW - Non-linear susceptibility
KW - Proton irradiation
KW - SeTeIn
KW - thin films
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U2 - 10.1016/j.physb.2024.416663
DO - 10.1016/j.physb.2024.416663
M3 - Article
AN - SCOPUS:85207769214
SN - 0921-4526
VL - 696
JO - Physica B: Condensed Matter
JF - Physica B: Condensed Matter
M1 - 416663
ER -