The use of power spectrum density for surface characterization of thin films

Keyphrases

• 3D-AFM 50%
• AFM Micrographs 50%
• AFM Microscopy 50%
• Discrete Fourier Transformation 50%
• Fast Fourier 50%
• FFT Algorithm 50%
• Inverse Power Method 50%
• MATLAB Script 50%
• Morphological Observation 100%
• Power Spectral 100%
• Power Spectrum Density 100%
• Power Use 100%
• PSD Analysis 50%
• PSD Method 50%
• Spectral Computations 50%
• Surface Characterization 100%

Engineering

• Analysis Theory 33%
• Atomic Force Microscopy 33%
• Correlation Length 33%
• Illustrates 33%
• Image Analysis 33%
• Magnetron 33%
• Micrograph 33%
• Power Density 33%
• Power Spectra 100%
• Power Spectral Density 33%
• Radio Frequency 66%
• Root Mean Square 33%
• Surface Topography 33%
• Thin Films 100%
• Two Dimensional 33%